From: Jonathan Cameron Jonathan.Cameron@huawei.com
[ Upstream commit 1efc41035f1841acf0af2bab153158e27ce94f10 ]
in_ only occurs once in these attributes.
Fixes: 0baf29d658c7 ("staging:iio:documentation Add abi docs for capacitance adcs.") Signed-off-by: Jonathan Cameron Jonathan.Cameron@huawei.com Reviewed-by: Andy Shevchenko andy.shevchenko@gmail.com Link: https://lore.kernel.org/r/20220626122938.582107-3-jic23@kernel.org Signed-off-by: Sasha Levin sashal@kernel.org --- Documentation/ABI/testing/sysfs-bus-iio | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index e81ba6f5e1c8..6e1b925f30bf 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -196,7 +196,7 @@ Description: Raw capacitance measurement from channel Y. Units after application of scale and offset are nanofarads.
-What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw +What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw KernelVersion: 3.2 Contact: linux-iio@vger.kernel.org Description: