25 Nov
2025
25 Nov
'25
5:38 p.m.
On Mon, Nov 24, 2025 at 3:20 AM Raghavendra Rao Ananta rananta@google.com wrote:
On Fri, Nov 21, 2025 at 11:44 PM David Matlack dmatlack@google.com wrote:
This series adds support for tests that use multiple devices, and adds one new test, vfio_pci_device_init_perf_test, which measures parallel device initialization time to demonstrate the improvement from commit e908f58b6beb ("vfio/pci: Separate SR-IOV VF dev_set").
Apart from a couple of minor nits in patch-6: Reviewed-by: Raghavendra Rao Ananta rananta@google.com
Thanks Raghu!
I'll send a v4 addressing your comments and the kernel-test-robot issues on riscv and i386. And then hopefully we can get this into 6.19.