Hi Dana,
Thanks for taking my comments into consideration.
Missatge de Dana Elfassy delfassy@redhat.com del dia dj., 22 de juny 2023 a les 16:35:
This patch introduces a specific test case for the EVIOCGLED ioctl. The test covers the case where len > maxlen in the EVIOCGLED(sizeof(all_leds)), all_leds) ioctl.
If I understand correctly this covers the same code path in the kernel as the EVIOCGKEY test [1] that you sent before. The only difference is that from the userspace point of view, the entry point is different, here you use EVIOCGLED as a trigerr and before you used EVIOCGKEY. But once in the kernel, the code path is the same. I am not sure if it makes really sense to repeat this test, but it is up to maintainers to decide. In any case, it looks good to me, so
Signed-off-by: Dana Elfassy dangel101@gmail.com
Reviewed-by: Enric Balletbo i Serra eballetbo@kernel.org
[1] https://patchwork.kernel.org/project/linux-kselftest/patch/20230622141802.13...
Changes in v2:
- Changed variable leds from an array to an int
This patch depends on '[v3] selftests/input: Introduce basic tests for evdev ioctls' [1] sent to the ML. [1] https://patchwork.kernel.org/project/linux-input/patch/20230607153214.15933-...
tools/testing/selftests/input/evioc-test.c | 17 +++++++++++++++++ 1 file changed, 17 insertions(+)
diff --git a/tools/testing/selftests/input/evioc-test.c b/tools/testing/selftests/input/evioc-test.c index ad7b93fe39cf..378db2b4dd56 100644 --- a/tools/testing/selftests/input/evioc-test.c +++ b/tools/testing/selftests/input/evioc-test.c @@ -234,4 +234,21 @@ TEST(eviocsrep_set_repeat_settings) selftest_uinput_destroy(uidev); }
+TEST(eviocgled_get_all_leds) +{
struct selftest_uinput *uidev;int leds = 0;int rc;rc = selftest_uinput_create_device(&uidev, -1);ASSERT_EQ(0, rc);ASSERT_NE(NULL, uidev);/* ioctl to set the maxlen = 0 */rc = ioctl(uidev->evdev_fd, EVIOCGLED(0), leds);ASSERT_EQ(0, rc);selftest_uinput_destroy(uidev);+}
TEST_HARNESS_MAIN
2.41.0